Autor
eggert@mikroanalytik.de
since 2006
Senior Scientist / Software
EDAX Inc. (AMETEK)
(
www.edax.com)
2007-2004
Additional project work
IfG - Institute for Scientific Instruments GmbH
(
ifg-adlershof.de)
and
IAP - Institut für Angewandte Photonik e.V.
(
iap-adlershof.de)
Software for X-Ray Fluorescence Analysis (XRF) / Micro-XRF /
processing and quantitative evaluation of energy dispersive XRF-spectra
(iMOXS-Quant / Pascal- and C++ program language)
since 2002
Additional independent work with project
mikroanalytik.de
(
www.microanalyst.net)
Data base for evaluation of X-ray spectra / spectra simulation EPMA
(MA-Table / Pascal- and C++ program language / data base)
2006-2001
Employee for software / application
Röntgenanalytik Apparatebau GmbH
(
roentgenanalytik.de)
Software for X-ray fluorescence / analysis of thin layers / digital pulse processor
(Pascal- und C++program language / data base)
2001-1992 Product Manager Microanalysis / Director R&D (since 1995) with RÖNTEC GmbH
EDR-288 /M-Serie and EDWIN Microanalysis Devices, quantitative spectra evaluation
(RT-Tools and WinTools with PUzaf / program language: Pascal)
1991-1983 Employee ZWG/AdW
EDR-184 Mikroanalysis Device, quantitative spectra evaluation (QMA-184 /program language: BASIC)
1983-1978
Study of Physics Science at Technical University (TU), Dresden
(1981-1983) praktica and diploma degree with EPMA methods
"Possibilities of Quantitative Element Analysis with Direct Inclusion of
Bremssrahlung Background Into Analytical Problem"
EGGERT, F.
'EDX-Spectra Simulation in Electron Probe Microanalysis,
Optimization of Excitation Conditions and Detection Limits'
Microchimica Acta 155 (2006) 129-136
( correction
download correction
)
PROCOP,M.; HODOROABA,V.-D.; BJEOUMIKHOV,A.; EGGERT,F.; WEDELL,R.
'Combination of Electron Probe Microanalysis and X-Ray Fluorescence Analysis
in a Scanning Electron Microscope'
Microscopy Societ of South Africa - Proceedings Vol.36 (2006) 26
STRÜDER,L.; MEIDINGER,N.; STOTTER,D.; KEMMER,J.; LECHNER,P.; LEUTENEGGER,P.; SOLTAU,H.;
EGGERT,F.; ROHDE,M.; SCHÜLEIN,T.
'High-Resolution X-ray Spectroscopy Close to Room Temperature'
Downloads
Microsc. Microanal. 4(6)(1998) 622-631
EGGERT, F.
'Effektivität Energiedispersiver Röntgenspektrometer im Energiebereich
kleiner 1 keV'
Downloads
Beitr. Elektronenmikroskop. Direktabb. Oberfl. 29 (1996) 31
EGGERT, F.
'Standardfreie Elektronenstrahl-Mikroanalyse'
Downloads
Beitr. Elektronenmikroskop. Direktabb. Oberfl. 27 (1994) 15
EGGERT, F.; MANECK,M.; SCHOLZE,F.; KRUMREY,M.; TEGELER,E.
Rev. Sci. Instrum. 62 (1991) 741
EGGERT, F.
'To Simple, Practical Correction Procedures for Spectra Processing in
Energy-Dispersive X-Ray Spectrometry'
X-Ray Spectrometry 19 (1990) 97
EGGERT, F.
'The efficiency of peak deconvolution based on probability theory in comparison
with other linear deconvolution methods'
Transact. 12. Intern. Congr. on X-Ray Optics and Microanalysis, Cracow (1989) 75
EGGERT, F.; HECKEL, J.
'Die standardfrie quantitative Analyse auf der Basis der lokalen Peak/Untergrund-
Verhältnisse mit dem energiedispersiven Röntgenmikroanalysator EDR-184'
Experim. Techn. d. Physik 34 (1986) 201
EGGERT, F.; SCHOLZ, W.
'A Rapid Deconvolution Method Based on the Bayesian Theorem Applied to
Energy Dispersive X-Ray Emission Analysis - Improvements and Error Influences'
phys. stat. sol. (a) 97 (1986) K9
EGGERT, F.; SCHOLZ, W.
'A Rapid Deconvolution Method Based on the Bayesian Theorem Applied to
Energy Dispersive X-Ray Emission Analysis'
phys. stat. sol. (a) 88 (1985) K123
EGGERT, F.
'Eine schnelle Methode zu Berechnung des Bremsstrahlungsuntergrundes für die
energiedispersive Elektronenstrahl-Mikroanalyse'
Experim. Techn. d. Phys. 33 (1985) 441
