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scanning electron microscope image, X-ray microanalysis electron spot, Scanning Electron Microscope (SEM) image of rock material X-ray microanalysis, X-ray spectrum from an EDX (EDS) system, with element identification (qualitative analysis)    
ColorSEM image, element distribution with EDX (Energy Dispersive X-ray Spectrometer) secondary electron SEM-image of a transistor ColorSEM image, element distribution (the transistor surface, element imaging with X-ray spectrometry)

The electron beam microanalysis (or Electron Probe Microanalysis ' EPMA ') with energy dispersive x-ray spectrometer (EDX) became a very much spread analysis method. It is an efficient microanalysis technology with minimum detectable substance quantities of less than 0,1 pico-gram. EPMA is used in all areas of the Nature Sciences, in Medicine, Technology, even in Forensic and everywhere, where Scanning Electron Microscopes are in operation.

The "micro analyst" has a very interesting working sphere. He or she goes into the world of microscopic dimensions. The micro world is opened...      


This homepage provides information about X-ray spectrometry, EDX (EDS)
and X-ray microanalysis, downloads and a forum for discussion!


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Last update:    01/18/2015                                              ©    Frank Eggert (if not differently indicated)

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